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Electrical probing (failure analysis)

A simple task in the world of electronics is the measurement of an I-V curve of a single transistor. However, if the size of the transistor is reduced to a few hundred nanometres, this task becomes very challenging. Probing on small structures requires high positioning accuracy and a very stable probing system. Our probing solutions exceed the necessary requirements, providing you with a fast and simple system to effectively increase your probing throughput.

Characterization of 130 nm SRAM
More images Characterization of 130 nm SRAM
Probing on sub 100 nm technology
More images Probing on sub 100 nm technology
Probing a 5 µm structure
More images Probing a 5 µm structure
Four-point electrical probing
More images Four-point electrical probing
Two-point electrical probing
More images Two-point electrical probing