Kleindiek Nanotechnik
  
Email this page  
Print this page  
Site map  
Back to top  

Micromanipulator for Electron Microscopy

Over the last few years, the MM3A-EM micromanipulator has created an unparalleled new dimension of quality in the field of Electron Microscopy. It is employed in a wide spectrum of SEM, FIB and other microscopes for an even wider range of applications and it has become the industry standard for OEM and retrofit solutions.

Give your microscope a hand: use the MM3A-EM to add new capabilities and functionality to your instrument.

More images MM3A-EM micromanipulator
More compact and more flexible
  • Small and practical
  • Plug-and-play system with modular components
  • Interfacing solutions for most SEM/FIB instruments (including load lock)
  • Fast setup and removal
  • Effortless work with multiple manipulators
  • Useful plug-in tools
Clearer and simpler
  • Result-oriented operation and increased throughput
  • Intuitive control interfaces and software
  • User-friendly and easy to learn
  • Quick and easy probe tip exchange
  • Compact, stand-alone electronics with PC interface
  • Pioneering cabling technology with compact vacuum feedthrough
More robust and more stable
  • Compact construction delivers higher resonance frequencies
  • Excellent stability
  • Low drift (1 nm/min)
  • Reliable operation (one year endurance test)
  • Virtually insusceptible to vibrations
  • Fast pre-positioning by hand
Faster and more precise
  • No backlash or reversal play
  • Sub-nanometer resolution (0.25 nm)
  • Extensive working range (100 cm³)
  • No "blind axis" like with cartesian systems
  • Integrated coarse and fine displacement in one drive
  • High operating velocity (up to 10 mm/sec)
Technical specifications

A = up / down  ·  B = left / right  ·  C = in / out

  • Length  60 mm
  • Width  22 mm
  • Height  25 mm
  • Weight  45 g
  • Operating range AB  240°
    Operating range C  12 mm
  • Piezo range A  4 × 10e-4 rad (20 µm)
    Piezo range B  4 × 10e-4 rad (15 µm)
    Piezo range C  1 µm
  • Speed AB  up to 10 mm/s
    Speed C  up to 2 mm/s
  • Resolution A  10e-7 rad (5 nm)
    Resolution B  10e-7 rad (3.5 nm)
    Resolution C  0.25 nm
  • Holding force  1 N
  • Holding torque  3 to 4 Nmm
  • Lift Y  5 g
  • Probing current range  10 nA to 100 mA
  • Maximum probing voltage  100 V
  • Probing signal resistance  7.0 Ω
  • Temperature range  273 K to 353 K
    UHV version  273 K to 393 K
    Low temp. version  77 K (4 K*) to 393 K
  • Lowest pressure  10e-7 mbar
    UHV version  2 × 10e-10 mbar
  • Mounting  M4 tapped hole
  • Material  Stainless steel, aluminium

* Requires special control unit


All technical specifications are approximate. Due to continuous development,
we reserve the right to change specifications without notice.

Applications

Electrical probing (FA)

Nanomanipulation

In-situ lift-out

Plug-in tools

Micro four-point probe

Microgripper

Rotational tip

Low-current measurement kit

Safe tip approach

Microinjector

Force measurement system

Videos

Demo

System setup

Probe tip exchange

Example of SEM/FIB interfacing solution

Documents

Brochure

Interfacing options
for SEM and FIB

Blueprint

 

  All rights reserved