Kleindiek Nanotechnik
  
Email this page  
Print this page  
Site map  
Back to top  

Micromanipulator for Light Microscopy

The MM3A-LMP micromanipulator is an economical and flexible alternative to conventional semiconductor probing instruments. Electrical measurements require probers to have low drift, high precision, a large working range and also to be insensitive to environmental conditions.

The MM3A-LMP outshines conventional probers in all these aspects. It is designed for measurements on 45 nm, 65 nm, 90 nm and larger technology and it offers unsurpassed stability, extreme precision and the flexibility to allow you to create your own prober station.

More images MM3A-LMP micromanipulator
More compact and more flexible
  • Small and practical
  • Plug-and-play system with modular components
  • Interfacing solutions for all light microscopes and prober stations
  • Fast setup and removal
  • Effortless work with multiple manipulators
  • Useful plug-in tools
Clearer and simpler
  • Result-oriented operation and increased throughput
  • Intuitive control interfaces and software
  • User-friendly and easy to learn
  • Quick and easy probe tip exchange
  • Compact, stand-alone electronics with PC interface
  • Reduced interference due to pioneering cabling technology
More robust and more stable
  • Compact construction delivers higher resonance frequencies
  • Excellent stability
  • Low drift (1 nm/min)
  • Reliable operation (one year endurance test)
  • Virtually insusceptible to vibrations
  • Fast pre-positioning by hand
Faster and more precise
  • No backlash or reversal play
  • Sub-nanometer resolution (0.25 nm)
  • Extensive working range (100 cm³)
  • No "blind axis" like with cartesian systems
  • Integrated coarse and fine displacement in one drive
  • High operating velocity (up to 10 mm/sec)
Technical specifications

A = up / down  ·  B = left / right  ·  C = in / out

  • Length  60 mm
  • Width  22 mm
  • Height  25 mm
  • Weight  45 g
  • Operating range AB  240°
    Operating range C  12 mm
  • Piezo range A  4 × 10e-4 rad (20 µm)
    Piezo range B  4 × 10e-4 rad (15 µm)
    Piezo range C  1 µm
  • Speed AB  up to 10 mm/s
    Speed C  up to 2 mm/s
  • Resolution A  10e-7 rad (5 nm)
    Resolution B  10e-7 rad (3.5 nm)
    Resolution C  0.25 nm
  • Holding force  1 N
  • Holding torque  3 to 4 Nmm
  • Lift Y  5 g
  • Probing current range  10 nA to 100 mA
  • Maximum probing voltage  100 V
  • Probing signal resistance  7.0 Ω
  • Temperature range  273 K to 353 K
  • Lowest pressure  Not vacuum compatible
  • Mounting  Magnetic
  • Material  Stainless steel, aluminium


All technical specifications are approximate. Due to continuous development,
we reserve the right to change specifications without notice.

Applications

Electrical probing (FA)

Nanomanipulation

Ex-situ lift-out

Plug-in tools

Micro four-point probe

Microgripper

Rotational tip

Low-current measurement kit

Safe tip approach

Force measurement system

Videos

Demo

System setup

Probe tip exchange

Documents

Brochure

Blueprint

 

  All rights reserved