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Electrical probing (failure analysis)

A simple task in the world of electronics is the measurement of an I-V curve of a single transistor. However, if the size of the transistor is reduced to a few hundred nanometres, this task becomes very challenging. Probing on small structures requires high positioning accuracy and a very stable probing system. Our probing solutions exceed the necessary requirements, providing you with a fast and simple system to effectively increase your probing throughput.

Probing on sub 100 nm technology
More images Probing on sub 100 nm technology
Probing a 5 µm structure
More images Probing a 5 µm structure
Four-point electrical probing
More images Four-point electrical probing
Two-point electrical probing
More images Two-point electrical probing