Electrical probing (failure analysis)

A simple task in the world of electronics is the measurement of an I-V curve of a single transistor. However, if the size of the transistor is reduced to a few tens of nanometres, this task becomes very challenging. Probing on small structures requires high positioning accuracy and a very stable probing system. Our probing solutions exceed the necessary requirements, providing you with a fast and simple system to effectively increase your probing throughput.

Have a look at the examples below of failure analysis tasks that have been done recently using our products.