Ex-situ lift-out

Sample preparation is a necessary prerequisite for transmission electron microscopy (TEM), but it can be time consuming and costly. The procedure for transferring the lamella to the TEM grid can be performed faster outside the focused ion beam (FIB) by making use of a light microscope and a highly stable and precise micromanipulator. The time required for preparation of the specimen can thus be reduced and the expensive use of the FIB can also be saved.

Below is an example of how ex-situ lift-out using our products.