Lift-out Shuttle


In-situ lift-out techniques have become more reliable methods for preparation of samples requiring TEM and atom probe inspection. However, despite their new-found popularity, they remain considerably more expensive than ex-situ lift-out techniques and require lots of valuable time in the Focused Ion Beam (FIB). Time and cost factors call for a faster, simpler procedure without reducing the reliability of the technique.

The Lift-out Shuttle is our answer to this problem: a simple and efficient tool offering the benefits of decreased cost, increased sample throughput, reduced FIB time and reliable results.