Kleindiek Nanotechnik GmbH

Presentations archive

Electrical characterization

Chen, Q., Wie, X.L., Wang, S. and Peng L.-M., 2006. Manipulating and measuring carbon nanotubes inside SEM using a probe system.

In-situ & ex-situ lift-out

Altmann, F., 2004. TEM-Zielpräparation unter REM-Beobachtung mit der Zeiss NTS Crossbeam.

Life science

Hess, D., 2005. Local and defined application of drugs on dendrites of cultured hippocampal neurons.

Nanoindentation

Utke, I. and Michler, J., 2006. In-situ SEM fabrication, manipulation and mechanical investigations of composite and Si nanowires.

 

 

Applications

Products

Support

Customers

References

Publications

Presentations

Company

Contact us

  Back to top   Site map Imprint/Privacy Policy © Kleindiek Nanotechnik GmbH