In-situ lift-out (INLO) techniques have become more reliable methods for preparation of samples requiring TEM and atom probe inspection. However, despite their new-found popularity, they remain considerably more expensive than ex-situ lift-out techniques and require lots of valuable time on the FIB. Time and cost factors call for a faster, simpler procedure without reducing the reliability of the technique.

The Lift-out Shuttle is Kleindiek Nanotechnik’s answer to this problem: a simple and efficient tool offering the benefits of decreased cost, increased sample throughput, reduced FIB time and reliable results.

• Kleindiek Nanotechnik’s innovative Lift-out Shuttle is an intuitive and cost-effective sample preparation solution that offers greater reliability than ex-situ lift-out techniques and higher throughput than other in-situ lift-out solutions.
• The Lift-out Shuttle has a diameter of 50 mm and is compatible with the load-lock systems of most SEMs and FIBs.
• When coupled with the use of Kleindiek’s SEM-compatible glue, the Lift-out Shuttle eliminates the need for gas precursors and thus the contamination of the sample associated with IBID techniques.